Showing 1 - 5 of 5 Results
1.
2006 8th Electronic Packaging Technology Conference by IEEE Reliability/CPMT/ED Si... ISBN: 9781424406647 List Price: $340.00
2.
2006 International Symposium on the Physical and Failure Analysis of ICs by Gan, Chee Lip, IEEE Reliabi... ISBN: 9781424402052 List Price: $208.00
3.
2005 7th Electronic Packaging Technology Conference by Mui, Yew Cheong, IEEE Relia... ISBN: 9780780395787 List Price: $242.00
5.
2005 12th International Symposium on Physical and Failure Analysis of ICs by Tung, Chih-Hang, IEEE Singa... ISBN: 9780780393011 List Price: $196.00